LOW-TEMPERATURE DEPENDENCE OF THE OPERATIONAL CHARACTERISTICS OF CMOS OP-AMPS

被引：0
|
作者：
DEEN, MJ [1 ]
TO, KC [1 ]
机构：
[1] SIMON FRASER UNIV,SCH ENGN SCI,BURNABY V5A 1S6,BC,CANADA
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1987年 / 134卷 / 8B期
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D O I：
暂无
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
引用
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页码：C429 / C429
页数：1
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