COMMENTS ON USE OF APPEARANCE POTENTIAL SPECTROMETER

被引：2

作者：

SKEATS, AP ^{[1
]}

CHAPMAN, BN ^{[1
]}

机构：

[1] IMPERIAL COLL,DEPT ELECT ENGN,MAT SECT,LONDON SW7 2BT,ENGLAND

来源：

VACUUM | 1972年 / 22卷 / 11期

关键词：

D O I：

10.1016/0042-207X(72)90024-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：557 / 559

页数：3

共 50 条

[1] A NEW APPEARANCE POTENTIAL SPECTROMETER
PAVLUCH, J
ECKERTOVA, L
CZECHOSLOVAK JOURNAL OF PHYSICS, 1985, 35 (06) : 630 - 642
[2] COMPACT APPEARANCE-POTENTIAL SPECTROMETER
MUSKET, RG
TAATJES, SW
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (02): : 1041 - &
[3] FIELD EMITTER ARRAY APPEARANCE POTENTIAL SPECTROMETER
GRAY, HF
MORAR, JF
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) : C103 - C103
[4] A VERSATILE SOFT-X-RAY APPEARANCE POTENTIAL SPECTROMETER
PADALIA, BD
SHINDE, PS
KORGAONKAR, AV
CARVALHO, WCJ
REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (04): : 1109 - 1110
[5] VERSATILE SOFT-X-RAY APPEARANCE POTENTIAL SPECTROMETER
LONG, RL
BEAVIS, LC
REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (06): : 939 - &
[6] DIRECT MEASUREMENT OF IONIZATION PROBABILITY AND APPEARANCE POTENTIAL USING A MASS SPECTROMETER
FOX, RE
HICKAM, WM
KJELDAAS, T
GROVE, DJ
PHYSICAL REVIEW, 1952, 85 (04): : 707 - 707
[7] THEORETICAL COMMENTS ON EXTENDED APPEARANCE POTENTIAL FINE-STRUCTURE (EAPFS)
LARAMORE, GE
EINSTEIN, TL
ROELOFS, LD
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1980, 25 (03): : 428 - 428
[8] Comments on quasicrystals and their potential use as catalysts
Jenks, CJ
Thiel, PA
JOURNAL OF MOLECULAR CATALYSIS A-CHEMICAL, 1998, 131 (1-3) : 301 - 306
[9] SOFT X-RAY APPEARANCE POTENTIAL SPECTROMETER FOR ANALYSIS OF SOLID SURFACES
PARK, RL
HOUSTON, JE
SCHREINER, DG
REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (12): : 1810 - +
[10] EFFECT OF SHIELD VOLTAGE ON APPEARANCE POTENTIAL MEASUREMENTS USING A MASS-SPECTROMETER
TAJIMA, S
SHIMIZU, Y
TSUCHIYA, T
BULLETIN OF THE CHEMICAL SOCIETY OF JAPAN, 1972, 45 (03) : 931 - +

← 1 2 3 4 5 →