COLUMN APPROXIMATION EFFECTS IN HIGH RESOLUTION ELECTRON MICROSCOPY USING WEAK DIFFRACTED BEAMS

被引：46

作者：

HOWIE, A

SWORN, CH

机构：

来源：

PHILOSOPHICAL MAGAZINE | 1970年 / 22卷 / 178期

关键词：

D O I：

10.1080/14786437008220955

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：861 / &

共 5 条

[1] INVESTIGATIONS OF DISLOCATION STRAIN FIELDS USING WEAK BEAMS [J].

COCKAYNE, DJ ;

RAY, ILF ;

WHELAN, MJ .

PHILOSOPHICAL MAGAZINE, 1969, 20 (168) :1265-&

[2]

COCKAYNE DJH, 1970, THESIS U OXFORD

[3]

HIRSCH PB, 1965, ELECTRON MICROS, pCH12

[4] APPROXIMATIONS OF DYNAMICAL THEORY OF DIFFRACTION CONTRAST [J].

HOWIE, A ;

BASINSKI, ZS .

PHILOSOPHICAL MAGAZINE, 1968, 17 (149) :1039-&

[5] RECIPROCITY IN ELECTRON DIFFRACTION AND MICROSCOPY [J].

POGANY, AP ;

TURNER, PS .