TOF ATOM-PROBE FIM STUDY OF LAB6 SINGLE-CRYSTALS

被引:0
|
作者
NAKAMURA, S [1 ]
NG, YS [1 ]
TSONG, TT [1 ]
MCLANE, SB [1 ]
机构
[1] PENN STATE UNIV,DEPT PHYS,UNIVERSITY PK,PA 16802
关键词
D O I
暂无
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:247 / 248
页数:2
相关论文
共 50 条
  • [1] TOF ATOM-PROBE FIM STUDY OF LAB6 SINGLE-CRYSTALS
    NAKAMURA, S
    NG, YS
    TSONG, TT
    MCLANE, SB
    SURFACE SCIENCE, 1979, 87 (02) : 656 - 664
  • [2] AN ATOM-PROBE ANALYSIS OF LAB6(001) PLANE
    MURAKAMI, K
    ADACHI, T
    KURODA, T
    NAKAMURA, S
    KOMODA, O
    SURFACE SCIENCE, 1983, 124 (2-3) : L25 - L30
  • [3] FIM AND ATOM-PROBE STUDY OF POLYMERS
    MARUYAMA, T
    HASEGAWA, Y
    NISHI, T
    SAKURAI, T
    JOURNAL DE PHYSIQUE, 1987, 48 (C-6): : 269 - 274
  • [4] SINGLE ATOM DETECTABILITY OF A TOF ATOM-PROBE
    SAKURAI, T
    HASHIZUME, T
    JIMBO, A
    JOURNAL DE PHYSIQUE, 1984, 45 (NC9): : 343 - 347
  • [5] TOF ATOM-PROBE FIM INVESTIGATION OF SURFACE SEGREGATION IN DILUTE ALLOYS
    NG, YS
    TSONG, TT
    SURFACE SCIENCE, 1978, 78 (02) : 419 - 438
  • [6] THERMIONIC WORK FUNCTION OF LAB6 SINGLE-CRYSTALS AND THEIR SURFACES
    OSHIMA, C
    BANNAI, E
    TANAKA, T
    KAWAI, S
    JOURNAL OF APPLIED PHYSICS, 1977, 48 (09) : 3925 - 3927
  • [7] PREPARATION OF LAB6 SINGLE-CRYSTALS BY THE FLOATING ZONE METHOD
    OTANI, S
    HONMA, S
    ISHIZAWA, Y
    JOURNAL OF ALLOYS AND COMPOUNDS, 1993, 193 (1-2) : 286 - 288
  • [8] QUANTIFICATION OF ATOM-PROBE FIM DATA
    TSONG, TT
    NG, YS
    ULTRAMICROSCOPY, 1979, 4 (03) : 383 - 384
  • [9] AUTOMATIC PREPARATION OF LAB6 SINGLE-CRYSTALS BY THE FLOATING ZONE TECHNIQUE
    OTANI, S
    TANAKA, T
    ISHIZAWA, Y
    JOURNAL OF CRYSTAL GROWTH, 1990, 100 (03) : 658 - 660
  • [10] MICROHARDNESS OF LAB6 SINGLE-CRYSTALS AND THEIR RESISTANCE TO ION-BOMBARDMENT
    MOROZOV, VV
    MALNEV, VI
    DUB, SN
    LOBODA, PI
    KRESANOV, VS
    INORGANIC MATERIALS, 1984, 20 (08) : 1225 - 1226