Development of Multi-wire Electric Discharge Machining for SiC Wafer Processing

被引:4
|
作者
Ogawa, Masumi [1 ]
Mine, Kei [1 ]
Fuchiyama, Seiki [1 ]
Tawa, Yasuhiro [1 ]
Kato, Tomohisa [2 ]
机构
[1] Natl Inst Adv Ind Sci & Technol AIST Tsukuba West, R&D Partnership Future Power Elect Technol FUPET, 16-1 Onogawa, Tsukuba, Ibaraki 3058569, Japan
[2] Adv Power Elect Res Ctr ADPERC, Natl Inst Adv Ind Sci & Technol AIST, Tsukuba, Ibaraki 3058569, Japan
关键词
Electric Discharge Machining (EDM); Wafer processing; Silicon Carbide; SILICON-CARBIDE;
D O I
10.4028/www.scientific.net/MSF.778-780.776
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
In order to slice the larger size ingot toward 6 inch of silicon carbide (SiC), we are developing Multi-wire Electric Discharge Machining (EDM). To prevent wire break during slicing, we have developed the electric discharge pulse control system. So far, with 10 multi-wires, we have succeeded in slicing of 4 inch SiC balk single crystal without wire break. High quality slicing surface (e.g. small value of around 10 pm of SORT for 3 inch wafer) was also achieved. By polishing method, EDM-sliced wafer was estimated to have the uniform thickness of damaged layer over the entire surface. We confirmed that the wafer sliced by EDM can be processed in the later process, by grinding the 3 inch wafer. And it was confirmed that 6 inch ingot can be sliced with 10 multi-wire EDM, by slicing the boule of SiC poly crystal. For the larger diameter ingot than 4 inch, Multi-wire EDM will be practically used by the effective removal of machining chips from the machining clearance between the wire and work.
引用
收藏
页码:776 / +
页数:2
相关论文
共 50 条
  • [41] A study of the processing characteristics of a multi-wire saw - Regarding the effects of slurry composition
    Suwabe, H
    Ishikawa, K
    INTERNATIONAL JOURNAL OF THE JAPAN SOCIETY FOR PRECISION ENGINEERING, 1999, 33 (02): : 120 - 121
  • [42] Research on the characteristics of multi-channel discharge in wire electrical discharge machining
    Hongwei Pan
    Zhidong Liu
    Cong Deng
    The International Journal of Advanced Manufacturing Technology, 2023, 129 : 3063 - 3071
  • [43] Research on the characteristics of multi-channel discharge in wire electrical discharge machining
    Pan, Hongwei
    Liu, Zhidong
    Deng, Cong
    INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2023, 129 (7-8): : 3063 - 3071
  • [44] Effect of SiC and rotation of electrode on electric discharge machining of Al-SiC composite
    Mohan, B
    Rajadurai, A
    Satyanarayana, KG
    JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 2002, 124 (03) : 297 - 304
  • [45] In-Situ Fabrication of Tube Electrodes with Array Slits using Multi-Wire Electrochemical Machining
    Yang, Tao
    Zeng, Yongbin
    Fang, Xiaolong
    Li, Yanliang
    INTERNATIONAL JOURNAL OF ELECTROCHEMICAL SCIENCE, 2020, 15 (02): : 1691 - 1703
  • [46] Towards achieving nanofinish on silicon (Si) wafer by μ-wire electro-discharge machining
    Jarin, Sams
    Saleh, Tanveer
    Muthalif, Asan G. A.
    Ali, Mohammad Yeakub
    Bhuiyan, Moinul
    INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2018, 99 (9-12): : 3005 - 3015
  • [47] Analysis of multi-spark in wire electrical discharge machining
    Yadav, Khuvendra
    Pradhan, Sharad K.
    MATERIALS TODAY-PROCEEDINGS, 2021, 38 : 474 - 484
  • [48] Towards achieving nanofinish on silicon (Si) wafer by μ-wire electro-discharge machining
    Sams Jarin
    Tanveer Saleh
    Asan G. A. Muthalif
    Mohammad Yeakub Ali
    Moinul Bhuiyan
    The International Journal of Advanced Manufacturing Technology, 2018, 99 : 3005 - 3015
  • [49] Study Spark Gap of Wire Electric Discharge Machining on AISI 4140
    Deshmukh, Swarup S.
    Jadhav, Vijay S.
    Shrivastava, Ramakant
    MATERIALS TODAY-PROCEEDINGS, 2020, 22 : 1812 - 1821
  • [50] Modeling and Efficiency Improvement of a Pulse Generator for Wire Electric Discharge Machining
    Kane, Makarand M.
    Khadse, Akshay
    Chandwani, Hitesh
    Bahirat, Himanshu
    Kulkarni, S., V
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 2020, 48 (10) : 3350 - 3357