X-ray scattering study of interfacial roughness in Nb/PdNi multilayers

被引：6

作者：

Vecchione, A. ^{[1
,2
]}

Fittipaldi, R. ^{[1
,2
]}

Cirillo, C. ^{[1
,2
]}

Hesselberth, M. ^{[3
]}

Aarts, J. ^{[3
]}

Prischepa, S. L. ^{[4
]}

Kushnir, V. N. ^{[4
]}

Kupriyanov, M. Yu ^{[5
]}

Attanasio, C. ^{[1
,2
]}

机构：

[1] Univ Salerno, CNR SPIN Salerno, I-84084 Fisciano, Sa, Italy

[2] Univ Salerno, Dipartimento Fis ER Caianiello, I-84084 Fisciano, Sa, Italy

[3] Leiden Univ, Kamerlingh Onnes Lab, NL-2300 RA Leiden, Netherlands

[4] Belarus State Univ Informat & Radioelect, Minsk 220013, BELARUS

[5] Moscow MV Lomonosov State Univ, Inst Nucl Phys, Moscow 119992, Russia

来源：

SURFACE SCIENCE | 2011年 / 605卷 / 19-20期

关键词：

Specular X-ray scattering; Diffuse X-ray scattering; Interfacial roughness; Metallic multilayers; X-ray reflectivity; Correlated roughness; Superconductivity; Ferromagnetism; SUPERCONDUCTING TRANSITION-TEMPERATURE; FERROMAGNET; REFLECTION; MAGNETISM;

D O I：

10.1016/j.susc.2011.06.013

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Specular and diffuse X-ray scattering are used to study interfacial roughness in Nb/Pd0.81Ni0.19 multilayers deposited by dc UHV sputtering. The data are analyzed to extract information about the correlated behavior of interface roughness in both the lateral and vertical directions. X-ray reflectivity is treated quantitatively by computer-aided simulation and modelling in order to extract values also for the layers thickness. From the analysis of the diffusive spectra of the reflectivity maps the roughness correlation has been evaluated. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：1791 / 1796

页数：6

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