Interleaved LDPC Decoding Scheme Improves 3-D TLC NAND Flash Memory System Performance

被引:1
|
作者
Yu, Xiaolei [1 ,2 ]
He, Jing [1 ,2 ]
Zhang, Bo [1 ,2 ]
Wang, Xianliang [1 ,2 ]
Li, Qianhui [1 ,2 ]
Wang, Qi [1 ]
Huo, Zongliang [1 ,3 ]
Ye, Tianchun [1 ]
机构
[1] Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
[2] Univ Chinese Acad Sci, Sch Elect Elect & Commun Engn, Beijing 100049, Peoples R China
[3] Yangtze Memory Technol Co Ltd, Beijing 100049, Peoples R China
关键词
Ash; Decoding; Three-dimensional displays; Iterative decoding; Reliability; Optimization; Memory management; 3-D triple-level cell (TLC) NAND flash memory; frame error rate (FER); LDPC; read latency; RETENTION;
D O I
10.1109/TCAD.2023.3266363
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Although NAND flash memory does a lot of work in effectively using error correcting code (ECC) to reduce uncorrectable bit error rate (UBER). However, if the frame error rate (FER) is not reduced, the lower UBER cannot effectively reduce the read latency of the flash memory system. This phenomenon is especially evident at the end of the flash memory lifetime, where conventional methods significantly reduce the UBER but not to zero, and the remaining error bits are still evenly distributed throughout the flash memory page, resulting in a significant increase in read latency. In this article, an interleaved LDPC decoding scheme is proposed. By re-evaluating the flash memory channel during the decoding process, the codewords in the flash memory page are corrected frame by frame, and the problem of high FER is solved at the end of the flash memory lifetime. Compared with the conventional algorithm, the proposed method can reduce the FER by up to 34%, reduce the average decoding iterations by 63.4%, and reduce the read latency by up to 65%.
引用
收藏
页码:4191 / 4204
页数:14
相关论文
共 50 条
  • [21] CHARACTERIZATION OF RELIABILITY IN 3-D NAND FLASH MEMORY
    Lee, Jong-Ho
    Joe, Sung-Min
    Kang, Ho-Jung
    2014 12TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT), 2014,
  • [22] REAL: A Retention Error Aware LDPC Decoding Scheme to Improve NAND Flash Read Performance
    Zhang, Meng
    Wu, Fei
    He, Xubin
    Huang, Ping
    Wang, Shunzhuo
    Xie, Changsheng
    2016 32ND SYMPOSIUM ON MASS STORAGE SYSTEMS AND TECHNOLOGIES (MSST), 2016,
  • [23] BeLDPC: Bit Errors Aware Adaptive Rate LDPC Codes for 3D TLC NAND Flash Memory
    Zhang, Meng
    Wu, Fei
    Yu, Qin
    Liu, Weihua
    Cui, Lanlan
    Zhao, Yahui
    Xie, Changsheng
    PROCEEDINGS OF THE 2020 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE 2020), 2020, : 302 - 305
  • [24] A Novel Program Operation Scheme With Negative Bias in 3-D NAND Flash Memory
    Sim, Jae-Min
    Kang, Myounggon
    Song, Yun-Heub
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2021, 68 (12) : 6112 - 6117
  • [25] Low-Complexity Detection and Decoding Scheme for LDPC-Coded MLC NAND Flash Memory
    Lin, Xusheng
    Han, Guojun
    Ouyang, Shijie
    Li, Yanfu
    Fang, Yi
    CHINA COMMUNICATIONS, 2018, 15 (06) : 58 - 67
  • [26] A joint-LDPC decoding scheme based on retention error characteristics for MLC NAND flash memory
    Wei, Debao
    Deng, Libao
    Hao, Mengqi
    Qiao, Liyan
    Peng, Xiyuan
    MICROPROCESSORS AND MICROSYSTEMS, 2018, 60 : 65 - 76
  • [27] Low-Complexity Detection and Decoding Scheme for LDPC-Coded MLC NAND Flash Memory
    Xusheng Lin
    Guojun Han
    Shijie Ouyang
    Yanfu Li
    Yi Fang
    中国通信, 2018, 15 (06) : 58 - 67
  • [28] Exploiting Binary Equilibrium for Efficient LDPC Decoding in 3D NAND Flash
    Hsu, Hsiang-Sen
    Chang, Li-Pin
    2022 IEEE 28TH INTERNATIONAL CONFERENCE ON EMBEDDED AND REAL-TIME COMPUTING SYSTEMS AND APPLICATIONS (RTCSA 2022), 2022, : 113 - 119
  • [29] Improved ISPP scheme for narrow threshold voltage distribution in 3-D NAND flash memory
    Yang, Giho
    Park, Chanyang
    Nam, Kihoon
    Kim, Donghyun
    Park, Min Sang
    Baek, Rock-Hyun
    SOLID-STATE ELECTRONICS, 2023, 202
  • [30] Lightweight Read Reference Voltage Calibration Strategy for Improving 3-D TLC NAND Flash Memory Reliability
    Feng, Hua
    Wei, Debao
    Wang, Yongchao
    Song, Yu
    Piao, Zhelong
    Qiao, Liyan
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2023, 23 (03) : 370 - 379