Crystallization, resistivity and microstructure of metal-silicon thin-film alloys

被引：0
|
作者：
Nava, F. [1 ]
机构：
[1] Univ di Modena, Italy
来源：
Philosophical Magazine B: Physics of Condensed Matter; Electronic, Optical and Magnetic Properties | 1990年 / 61卷 / 04期
关键词：
Kinetics of Crystallization - Metastable Phases - Silicides - Transmission Electron Microscopy;
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页码：601 / 625
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