Reconstructed structures of semiconductor interfaces by synchrotron radiation x-ray diffraction

被引：0
|
作者：
Mizuki, Jun'ichiro [1 ]
Akimoto, Koichi [1 ]
Hirosawa, Ichiro [1 ]
Matsui, Junji [1 ]
机构：
[1] NEC, Fundamental Research Lab
来源：
NEC Research and Development | 1991年 / 32卷 / 01期
关键词：
26;
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暂无
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摘要：
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页码：8 / 19
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