Nano-indentation for structural analysis of hydrogen- and nitrogen-containing carbon films

被引:0
|
作者
Tanaka, Daisuke [1 ]
Ohshio, Shigeo [1 ]
Saitoh, Hidetoshi [1 ]
机构
[1] Nagaoka University of Technology, Nagaoka, Niigata 940-2188, Japan
关键词
Annealing - Carbon nitride - Creep - Fourier transform infrared spectroscopy - Hydrogen - Hydrogenation - Indentation - Nitrogen - Raman spectroscopy - Strain rate - Structure (composition) - X ray photoelectron spectroscopy;
D O I
10.1143/jjap.39.6008
中图分类号
学科分类号
摘要
It is known that films of hard carbon materials, so-called hydrogenated diamond-like carbon (DLC:H) and nitrogen-containing DLC:H (DLC:N:H), are composed of medium-range ordered clusters. In this study, the boundary structure among medium-range ordered clusters is analyzed using a nano-indentation creep technique. DLC:H and DLC:N:H films were annealed at temperatures up to 500C for 10 h. Raman spectroscopy revealed that thermal annealing promoted the increase in the boundary proportion among clusters. The strain-rate sensitivity coefficient, m, of the film also indicated that cluster flow became notable with thermal annealing. The increase in cluster flow is understood in terms of the growth in the number of boundaries. Although these phenomena were observed in both DLC:H and DLC:N:H films, the degree of flow in the DLC:N:H film was greater than that in the DLC:H film after thermal annealing. The flow characteristic was enhanced by nitrogen incorporation into the carbon cluster and/or nitrogen terminating the carbon cluster, suggesting that nitrogen incorporation promoted the formation of a thermally instable and mechanically deteriorated structure.
引用
收藏
页码:6008 / 6015
相关论文
共 50 条
  • [1] Nano-indentation for structural analysis of hydrogen- and nitrogen-containing carbon films
    Tanaka, D
    Ohshio, S
    Saitoh, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (10): : 6008 - 6015
  • [2] Indentation creep of nitrogen-containing carbon films
    Nagaoka Univ of Technology, Nagaoka, Japan
    Jpn J Appl Phys Part 1 Regul Pap Short Note Rev Pap, 11 A (1452-1454):
  • [3] Indentation creep of nitrogen-containing carbon films
    Tanaka, D
    Ohshio, S
    Nishino, J
    Saitoh, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1996, 35 (11A): : L1452 - L1454
  • [4] Indentation creep analysis of amorphous nitrogen-containing carbon films
    Tanaka, D
    Ohshio, S
    Saitoh, H
    THIN-FILMS - STRESSES AND MECHANICAL PROPERTIES VII, 1998, 505 : 205 - 209
  • [5] Analysis of nano-indentation measurements on carbon nitride films
    Kusano, Y
    Hutchings, IM
    SURFACE & COATINGS TECHNOLOGY, 2003, 169 : 739 - 742
  • [6] Energetic analysis of Al/TiN multilayered films by nano-indentation
    AMS R and D C, Kanazawa Institute of Technology, 3-1 Yatsukaho, Matsutou, Ishikawa 924-0838, Japan
    Shinku/Journal of the Vacuum Society of Japan, 2001, 44 (02) : 100 - 104
  • [7] Structural and optical properties of nitrogen-containing tetrahedral amorphous carbon films
    D.H. Chen
    A.X. Wei
    S.P. Wong
    J.B. Xu
    M.M. Wu
    S.Q. Peng
    Applied Physics A, 2000, 70 (1) : 47 - 51
  • [8] Structural and optical properties of nitrogen-containing tetrahedral amorphous carbon films
    Chen, D.H.
    Wei, A.X.
    Wong, S.P.
    Xu, J.B.
    Wu, M.M.
    Peng, S.Q.
    Applied Physics A: Materials Science and Processing, 2000, 70 (01): : 47 - 51
  • [9] Structural and optical properties of nitrogen-containing tetrahedral amorphous carbon films
    Chen, DH
    Wei, AX
    Wong, SP
    Xu, JB
    Wu, MM
    Peng, SQ
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2000, 70 (01): : 47 - 51
  • [10] NANO-INDENTATION STUDIES OF ULTRAHIGH STRENGTH CARBON NITRIDE THIN-FILMS
    LI, D
    CHUNG, YW
    WONG, MS
    SPROUL, WD
    JOURNAL OF APPLIED PHYSICS, 1993, 74 (01) : 219 - 223